Full-chip leakage analysis for 65 nm CMOS technology and beyond - researchr publication authors

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Jiying Xue, Tao Li, Yangdong Deng, Zhiping Yu. Full-chip leakage analysis for 65 nm CMOS technology and beyond. Integration, 43(4):353-364, 2010. [doi]

This author has not been identified. Look up 'Jiying Xue' in GoogleThis author has not been identified. Look up 'Tao Li' in GoogleThis author has not been identified. Look up 'Yangdong Deng' in GoogleThis author has not been identified. Look up 'Zhiping Yu' in Google

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