Yufeng Xue, Lan Lin, Xin Sun, Fengguang Song. On A Simpler and Faster Derivation of Single Use Reliability Mean and Variance for Model-Based Statistical Testing (S). In Óscar Mortágua Pereira, editor, The 30th International Conference on Software Engineering and Knowledge Engineering, Hotel Pullman, Redwood City, California, USA, July 1-3, 2018. pages 635-634, KSI Research Inc. and Knowledge Systems Institute Graduate School, 2018. [doi]
Abstract is missing.