Lin Xue, Hiromasa Suzuki, Yutaka Ohtake, Hiroyuki Fujimoto, Makoto Abe, Osamu Sato, Toshiyuki Takatsuji. Numerical Analysis of the Feldkamp-Davis-Kress Effect on Industrial X-Ray Computed Tomography for Dimensional Metrology. J. Comput. Inf. Sci. Eng., 15(2), 2015. [doi]
Abstract is missing.