LSTM-Based Intelligent Fault Detection for Fuzzy Markov Jump Systems and Its Application to Tunnel Diode Circuits

Min Xue, Huaicheng Yan 0001, Meng Wang, Hao Shen 0001, Kaibo Shi. LSTM-Based Intelligent Fault Detection for Fuzzy Markov Jump Systems and Its Application to Tunnel Diode Circuits. IEEE Trans. Circuits Syst. II Express Briefs, 69(3):1099-1103, 2022. [doi]

Abstract

Abstract is missing.