Lim Shi Xuen, Ismail Mohd Khairuddin, Mohd Azraai Mohd Razman, Jessnor Arif Mat-Jizat, Edmund Yuen, Haochuan Jiang, Eng Hwa Yap, Anwar P. P. Abdul Majeed. The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation. In Jun Jo, Han-Lim Choi, Mardé Helbig, Hyondong Oh, Jemin Hwangbo, Chang Hun Lee, Bela Stantic, editors, Robot Intelligence Technology and Applications 7 - Results from the 10th International Conference on Robot Intelligence Technology and Applications, RiTA 2022, Daejeon, South Korea, 7-9 December, 2022. Volume 642 of Lecture Notes in Networks and Systems, pages 304-309, Springer, 2022. [doi]
@inproceedings{XuenKRMYJYM22,
title = {The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation},
author = {Lim Shi Xuen and Ismail Mohd Khairuddin and Mohd Azraai Mohd Razman and Jessnor Arif Mat-Jizat and Edmund Yuen and Haochuan Jiang and Eng Hwa Yap and Anwar P. P. Abdul Majeed},
year = {2022},
doi = {10.1007/978-3-031-26889-2_27},
url = {https://doi.org/10.1007/978-3-031-26889-2_27},
researchr = {https://researchr.org/publication/XuenKRMYJYM22},
cites = {0},
citedby = {0},
pages = {304-309},
booktitle = {Robot Intelligence Technology and Applications 7 - Results from the 10th International Conference on Robot Intelligence Technology and Applications, RiTA 2022, Daejeon, South Korea, 7-9 December, 2022},
editor = {Jun Jo and Han-Lim Choi and Mardé Helbig and Hyondong Oh and Jemin Hwangbo and Chang Hun Lee and Bela Stantic},
volume = {642},
series = {Lecture Notes in Networks and Systems},
publisher = {Springer},
isbn = {978-3-031-26889-2},
}