Lu Yin. Beyond Labels: Knowledge Elicitation using Deep Metric Learning and Psychometric Testing. In Christian Bessiere, editor, Proceedings of the Twenty-Ninth International Joint Conference on Artificial Intelligence, IJCAI 2020 [scheduled for July 2020, Yokohama, Japan, postponed due to the Corona pandemic]. pages 5214-5215, ijcai.org, 2020. [doi]
@inproceedings{YIn20-1,
title = {Beyond Labels: Knowledge Elicitation using Deep Metric Learning and Psychometric Testing},
author = {Lu Yin},
year = {2020},
doi = {10.24963/ijcai.2020/747},
url = {https://doi.org/10.24963/ijcai.2020/747},
researchr = {https://researchr.org/publication/YIn20-1},
cites = {0},
citedby = {0},
pages = {5214-5215},
booktitle = {Proceedings of the Twenty-Ninth International Joint Conference on Artificial Intelligence, IJCAI 2020 [scheduled for July 2020, Yokohama, Japan, postponed due to the Corona pandemic]},
editor = {Christian Bessiere},
publisher = {ijcai.org},
}