Makoto Yabuuchi, Hidehiro Fujiwara, Yasumasa Tsukamoto, M. Tanaka, Shinji Tanaka, Koji Nii. A 28nm high density 1R/1W 8T-SRAM macro with screening circuitry against read disturb failure. In Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013. pages 1-4, IEEE, 2013. [doi]
Abstract is missing.