Design of a Charge Sensitive Amplifier for Silicon Particle Detector in BCD 180 nm Process - researchr publication authors

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Indu Yadav, Ashish Joshi, Ettore Ruscino, Valentino Liberali, Attilio Andreazza, Hitesh Shrimali. Design of a Charge Sensitive Amplifier for Silicon Particle Detector in BCD 180 nm Process. In 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems, VLSID 2019, Delhi, India, January 5-9, 2019. pages 541-542, IEEE, 2019. [doi]

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