Characterization of High-Frequency Dielectric Laminates Using a Scanning-Probe Based on EBG Structure

Rahul Yadav, Piyush N. Patel. Characterization of High-Frequency Dielectric Laminates Using a Scanning-Probe Based on EBG Structure. IEEE T. Instrumentation and Measurement, 67(1):107-115, 2018. [doi]

Abstract

Abstract is missing.