Ayako Yagahara, Takumi Tanikawa, Katsuhiko Ogasawara, Hideto Yokoi. Integration of Japanese Medical Device Adverse Event Terminologies. In Adi V. Gundlapalli, Marie-Christine Jaulent, Dongsheng Zhao, editors, MEDINFO 2017: Precision Healthcare through Informatics - Proceedings of the 16th World Congress on Medical and Health Informatics, Hangzhou, China, 21-25 August 2017. Volume 245 of Studies in Health Technology and Informatics, pages 1345, IOS Press, 2017. [doi]
@inproceedings{YagaharaTOY17,
title = {Integration of Japanese Medical Device Adverse Event Terminologies},
author = {Ayako Yagahara and Takumi Tanikawa and Katsuhiko Ogasawara and Hideto Yokoi},
year = {2017},
doi = {10.3233/978-1-61499-830-3-1345},
url = {https://doi.org/10.3233/978-1-61499-830-3-1345},
researchr = {https://researchr.org/publication/YagaharaTOY17},
cites = {0},
citedby = {0},
pages = {1345},
booktitle = {MEDINFO 2017: Precision Healthcare through Informatics - Proceedings of the 16th World Congress on Medical and Health Informatics, Hangzhou, China, 21-25 August 2017},
editor = {Adi V. Gundlapalli and Marie-Christine Jaulent and Dongsheng Zhao},
volume = {245},
series = {Studies in Health Technology and Informatics},
publisher = {IOS Press},
isbn = {978-1-61499-830-3},
}