Vitaliy Yakovyna, Maksym Seniv, Ivan Symets. The Relation between Software Development Methodologies and Factors Affecting Software Reliability. In IEEE 15th International Conference on Computer Sciences and Information Technologies, CSIT 2020, Zbarazh, Ukraine, September 23-26, 2020 - Volume 1. pages 377-381, IEEE, 2020. [doi]
Abstract is missing.