Controlling of electrical and interface state density properties of ZnO: Co/p-silicon diode structures by compositional fraction of cobalt dopant

F. Yakuphanoglu. Controlling of electrical and interface state density properties of ZnO: Co/p-silicon diode structures by compositional fraction of cobalt dopant. Microelectronics Reliability, 51(12):2195-2199, 2011. [doi]

Abstract

Abstract is missing.