Hiromu Yakura, Shinnosuke Shinozaki, Reon Nishimura, Yoshihiro Oyama, Jun Sakuma. Malware Analysis of Imaged Binary Samples by Convolutional Neural Network with Attention Mechanism. In Bhavani M. Thuraisingham, Battista Biggio, David Mandell Freeman, Brad Miller, Arunesh Sinha, editors, Proceedings of the 10th ACM Workshop on Artificial Intelligence and Security, AISec@CCS 2017, Dallas, TX, USA, November 3, 2017. pages 55-56, ACM, 2017. [doi]
Abstract is missing.