Tomoaki K. Yamabe, Yudai Miyashita, Shin-ichi Sato, Yudai Yamamoto, Akio Nakamura, Hirokatsu Kataoka. What is an Effective Feature for a Detection Problem? Feature Evaluation in Multiple Scenes. In 2015 IEEE International Conference on Systems, Man, and Cybernetics, Kowloon Tong, Hong Kong, October 9-12, 2015. pages 2926-2931, IEEE, 2015. [doi]
Abstract is missing.