Method of diagnosing multiple stuck-at-faults in combinational circuits

Teruhiko Yamada, Shuji Hamada, Tatsuo Matsumoto, Toshihiko Takahashi, Takao Nakayama. Method of diagnosing multiple stuck-at-faults in combinational circuits. Systems and Computers in Japan, 22(11):21-30, 1991. [doi]

Abstract

Abstract is missing.