Hiroshi Yamada, Shunsuke Okura, Masayoshi Shirahata, Takeshi Fujino. Modeling attacks against device authentication using CMOS image sensor PUF. IEICE Electronic Express, 18(7):20210058, 2021. [doi]
@article{YamadaOSF21, title = {Modeling attacks against device authentication using CMOS image sensor PUF}, author = {Hiroshi Yamada and Shunsuke Okura and Masayoshi Shirahata and Takeshi Fujino}, year = {2021}, doi = {10.1587/elex.18.20210058}, url = {https://doi.org/10.1587/elex.18.20210058}, researchr = {https://researchr.org/publication/YamadaOSF21}, cites = {0}, citedby = {0}, journal = {IEICE Electronic Express}, volume = {18}, number = {7}, pages = {20210058}, }