Vector Memory Expansion System For T33xx Logic Tester

Kazuhiro Yamada, Yoshikazu Takahashi. Vector Memory Expansion System For T33xx Logic Tester. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 392, IEEE Computer Society, 2002. [doi]

@inproceedings{YamadaT02,
  title = {Vector Memory Expansion System For T33xx Logic Tester},
  author = {Kazuhiro Yamada and Yoshikazu Takahashi},
  year = {2002},
  url = {http://csdl.computer.org/comp/proceedings/ats/2002/1825/00/18250392abs.htm},
  tags = {logic},
  researchr = {https://researchr.org/publication/YamadaT02},
  cites = {0},
  citedby = {0},
  pages = {392},
  booktitle = {11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-1825-7},
}