Takahiro J. Yamaguchi, H. X. Hou, Koji Takayama, Dave Armstrong, Masahiro Ishida, Mani Soma. An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-8, IEEE, 2007. [doi]
Abstract is missing.