Operation and Stability Analysis of Temperature-Insensitive MOS Reference Current Source with Self-Bias Circuit

Souma Yamamoto, Kuswan Isam Ebisawa, Yudai Abe, Takashi Ida, Yukiko Shibasaki, Nobukazu Tsukiji, Anna Kuwana, Haruo Kobayashi 0001, Akira Suzuki, Yukichi Todoroki, Toshihiko Kakinoki, Nobuto Ono, Kazuhiro Miura. Operation and Stability Analysis of Temperature-Insensitive MOS Reference Current Source with Self-Bias Circuit. In International SoC Design Conference, ISOCC 2020, Yeosu, South Korea, October 21-24, 2020. pages 137-138, IEEE, 2020. [doi]

Abstract

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