Yuta Yamato, Yusuke Nakamura, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara. A Novel Per-Test Fault Diagnosis Method Based on the Extended ::::X::::-Fault Model for Deep-Submicron LSI Circuits. IEICE Transactions, 91-D(3):667-674, 2008. [doi]
Abstract is missing.