Characterization of Organic Static Induction Transistors with Nano-Gap Gate Fabricated by Electron Beam Lithography

Hiroshi Yamauchi, Yasuyuki Watanabe, Masaaki Iizuka, Masakazu Nakamura, Kazuhiro Kudo. Characterization of Organic Static Induction Transistors with Nano-Gap Gate Fabricated by Electron Beam Lithography. IEICE Transactions, 91-C(12):1852-1855, 2008. [doi]

@article{YamauchiWINK08,
  title = {Characterization of Organic Static Induction Transistors with Nano-Gap Gate Fabricated by Electron Beam Lithography},
  author = {Hiroshi Yamauchi and Yasuyuki Watanabe and Masaaki Iizuka and Masakazu Nakamura and Kazuhiro Kudo},
  year = {2008},
  doi = {10.1093/ietele/e91-c.12.1852},
  url = {http://dx.doi.org/10.1093/ietele/e91-c.12.1852},
  researchr = {https://researchr.org/publication/YamauchiWINK08},
  cites = {0},
  citedby = {0},
  journal = {IEICE Transactions},
  volume = {91-C},
  number = {12},
  pages = {1852-1855},
}