Characterization of Organic Static Induction Transistors with Nano-Gap Gate Fabricated by Electron Beam Lithography - researchr publication related

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Hiroshi Yamauchi, Yasuyuki Watanabe, Masaaki Iizuka, Masakazu Nakamura, Kazuhiro Kudo. Characterization of Organic Static Induction Transistors with Nano-Gap Gate Fabricated by Electron Beam Lithography. IEICE Transactions, 91-C(12):1852-1855, 2008. [doi]

The following publications are possibly variants of this publication:

Fabrication and Device Simulation of Single Nano-Scale Organic Static Induction TransistorsNoboru Ohashi, Masakazu Nakamura, Norio Muraishi, Masatoshi Sakai, Kazuhiro Kudo. ieicet, 89-C(12):1765-1770, 2006. [doi]

Device preparation and characterization of drain current transients in static induction micro transistorsC. M. Joseph, T. Natsume, Masakazu Nakamura, Masaaki Iizuka, Kazuhiro Kudo. mj, 37(9):884-887, 2006. [doi]

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