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Reliability enhancement of 1Xnm TLC for cold flash and millennium memories

Senju Yamazaki, Shuhei Tanakamaru, Sakuya Suzuki, Tomoko Ogura Iwasaki, Shogo Hachiya, Ken Takeuchi. Reliability enhancement of 1Xnm TLC for cold flash and millennium memories. In Symposium on VLSI Circuits, VLSIC 2015, Kyoto, Japan, June 17-19, 2015. pages 112, IEEE, 2015. [doi]

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