Hiroshi Yamazaki, Motohiro Wakazono, Toshinori Hosokawa, Masayoshi Yoshimura. A don't care identification method for test compaction. In Lukás Sekanina, Görschwin Fey, Jaan Raik, Snorre Aunet, Richard Ruzicka, editors, 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, Karlovy Vary, Czech Republic, April 8-10, 2013. pages 215-218, IEEE Computer Society, 2013. [doi]
@inproceedings{YamazakiWHY13,
title = {A don't care identification method for test compaction},
author = {Hiroshi Yamazaki and Motohiro Wakazono and Toshinori Hosokawa and Masayoshi Yoshimura},
year = {2013},
doi = {10.1109/DDECS.2013.6549819},
url = {http://doi.ieeecomputersociety.org/10.1109/DDECS.2013.6549819},
researchr = {https://researchr.org/publication/YamazakiWHY13},
cites = {0},
citedby = {0},
pages = {215-218},
booktitle = {16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, Karlovy Vary, Czech Republic, April 8-10, 2013},
editor = {Lukás Sekanina and Görschwin Fey and Jaan Raik and Snorre Aunet and Richard Ruzicka},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-6135-4},
}