Koji Yamazaki, Teruhiko Yamada. An approach to diagnose logical faults in partially observable sequential circuits. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 168-173, IEEE Computer Society, 1997. [doi]
@inproceedings{YamazakiY97,
title = {An approach to diagnose logical faults in partially observable sequential circuits},
author = {Koji Yamazaki and Teruhiko Yamada},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090168abs.htm},
tags = {systematic-approach},
researchr = {https://researchr.org/publication/YamazakiY97},
cites = {0},
citedby = {0},
pages = {168-173},
booktitle = {6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan},
publisher = {IEEE Computer Society},
isbn = {0-8186-8209-4},
}