Guoqing Yan, Sen Chen, Yude Bail, Xiaohong Li. Can Deep Learning Models Learn the Vulnerable Patterns for Vulnerability Detection?. In Hong Va Leong, Sahra Sedigh Sarvestani, Yuuichi Teranishi, Alfredo Cuzzocrea, Hiroki Kashiwazaki, Dave Towey, Ji-Jiang Yang, Hossain Shahriar, editors, 46th IEEE Annual Computers, Software, and Applications Conferenc, COMPSAC 2022, Los Alamitos, CA, USA, June 27 - July 1, 2022. pages 904-913, IEEE, 2022. [doi]
Abstract is missing.