Yield-Driven Redundant Via Insertion Based on Probabilistic Via-Connection Analysis - researchr publication authors

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Jin-Tai Yan, Bo-Yi Chiang, Zhi-Wei Chen. Yield-Driven Redundant Via Insertion Based on Probabilistic Via-Connection Analysis. In 13th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2006, Nice, France, December 10-13, 2006. pages 874-877, IEEE, 2006. [doi]

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