Aibin Yan, Yu Chen, Zhengfeng Huang, Jie Cui 0004, Xiaoqing Wen. A High-Performance and P-Type FeFET-Based Non-Volatile Latch. In 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. pages 1-5, IEEE, 2023. [doi]
@inproceedings{YanCHCW23,
title = {A High-Performance and P-Type FeFET-Based Non-Volatile Latch},
author = {Aibin Yan and Yu Chen and Zhengfeng Huang and Jie Cui 0004 and Xiaoqing Wen},
year = {2023},
doi = {10.1109/ATS59501.2023.10318017},
url = {https://doi.org/10.1109/ATS59501.2023.10318017},
researchr = {https://researchr.org/publication/YanCHCW23},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0310-0},
}