Aibin Yan, Yu Chen, Zhengfeng Huang, Jie Cui 0004, Xiaoqing Wen. A High-Performance and P-Type FeFET-Based Non-Volatile Latch. In 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.