Advanced DICE Based Triple-Node-Upset Recovery Latch with Optimized Overhead for Space Applications

Aibin Yan, Xuehua Li, Zhongyu Gao, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen. Advanced DICE Based Triple-Node-Upset Recovery Latch with Optimized Overhead for Space Applications. In 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. pages 1-5, IEEE, 2023. [doi]

Abstract

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