An SEU resilient, SET filterable and cost effective latch in presence of PVT variations

Aibin Yan, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yiming Ouyang, Xuejun Li. An SEU resilient, SET filterable and cost effective latch in presence of PVT variations. Microelectronics Reliability, 63:239-250, 2016. [doi]

Abstract

Abstract is missing.