Peimin Yan, Yulong Mo. Using independent component analysis for electrical impedance tomography. In Edward R. Dougherty, Jaakko Astola, Karen O. Egiazarian, editors, Image Processing: Algorithms and Systems III, 19 January 2004, San Jose, California, USA. Volume 5289 of SPIE Proceedings, pages 447-454, SPIE, 2004. [doi]
Abstract is missing.