Haihua Yan, Adit D. Singh. Experiments in Detecting Delay Faults using Multiple Higher Frequency Clocks and Results from Neighboring Die. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 105-111, IEEE Computer Society, 2003. [doi]
Abstract is missing.