Haihua Yan, Adit D. Singh, Gefu Xu. Delay Defect Characterization Using Low Voltage Test. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 8-13, IEEE Computer Society, 2005. [doi]
@inproceedings{YanSX05,
title = {Delay Defect Characterization Using Low Voltage Test},
author = {Haihua Yan and Adit D. Singh and Gefu Xu},
year = {2005},
doi = {10.1109/ATS.2005.45},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.45},
tags = {testing},
researchr = {https://researchr.org/publication/YanSX05},
cites = {0},
citedby = {0},
pages = {8-13},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}