Kep Pen Yan, Yik Yee Tab. Application of Fluorescence Microscopy for Semiconductor Packaging Analysis. In Hamid R. Arabnia, editor, Proceedings of The 2005 International Conference on Computer Vision, VISION 2005, Las Vegas, Nevada, USA, June 20-23, 2005. pages 226-231, CSREA Press, 2005.
Abstract is missing.