Yaping Yan, Sheng Xiang, Hirokazu Asano, Shun'ichi Kaneko. Accumulated Aggregation Shifting Based on Feature Enhancement for Defect Detection on 3D Textured Low-Contrast Surfaces. In 24th International Conference on Pattern Recognition, ICPR 2018, Beijing, China, August 20-24, 2018. pages 2965-2970, IEEE Computer Society, 2018. [doi]
Abstract is missing.