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Compiler-guided register reliability improvement against soft errors

Jun Yan, Wei Zhang. Compiler-guided register reliability improvement against soft errors. In Wayne Wolf, editor, EMSOFT 2005, September 18-22, 2005, Jersey City, NJ, USA, 5th ACM International Conference On Embedded Software, Proceedings. pages 203-209, ACM, 2005. [doi]

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Jun Yan

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Wei Zhang

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