Jun Yan, Wei Zhang. Compiler-guided register reliability improvement against soft errors. In Wayne Wolf, editor, EMSOFT 2005, September 18-22, 2005, Jersey City, NJ, USA, 5th ACM International Conference On Embedded Software, Proceedings. pages 203-209, ACM, 2005. [doi]
@inproceedings{YanZ05:0,
title = {Compiler-guided register reliability improvement against soft errors},
author = {Jun Yan and Wei Zhang},
year = {2005},
doi = {10.1145/1086228.1086266},
url = {http://doi.acm.org/10.1145/1086228.1086266},
tags = {compiler, reliability},
researchr = {https://researchr.org/publication/YanZ05%3A0},
cites = {0},
citedby = {0},
pages = {203-209},
booktitle = {EMSOFT 2005, September 18-22, 2005, Jersey City, NJ, USA, 5th ACM International Conference On Embedded Software, Proceedings},
editor = {Wayne Wolf},
publisher = {ACM},
isbn = {1-59593-091-4},
}