Aibin Yan, Jun Zhou 0016, Yuanjie Hu, Yan Chen, Zhen Wu, Tianming Ni. Design of a Novel Self-Recoverable SRAM Cell Protected Against Soft Errors. In 6th International Conference on Dependable Systems and Their Applications, DSA 2019, Harbin, China, January 3-6, 2020. pages 497-498, IEEE, 2019. [doi]
Abstract is missing.