Kaiyuan Yang, David Blaauw, Dennis Sylvester. A robust -40 to 120°C all-digital true random number generator in 40nm CMOS. In Symposium on VLSI Circuits, VLSIC 2015, Kyoto, Japan, June 17-19, 2015. pages 248, IEEE, 2015. [doi]
@inproceedings{YangBS15-0,
title = {A robust -40 to 120°C all-digital true random number generator in 40nm CMOS},
author = {Kaiyuan Yang and David Blaauw and Dennis Sylvester},
year = {2015},
doi = {10.1109/VLSIC.2015.7231275},
url = {http://dx.doi.org/10.1109/VLSIC.2015.7231275},
researchr = {https://researchr.org/publication/YangBS15-0},
cites = {0},
citedby = {0},
pages = {248},
booktitle = {Symposium on VLSI Circuits, VLSIC 2015, Kyoto, Japan, June 17-19, 2015},
publisher = {IEEE},
isbn = {978-4-86348-502-0},
}