Improving the Reliability of MLC NAND Flash Memories Through Adaptive Data Refresh and Error Control Coding

Chengen Yang, Hsing-Min Chen, Trevor N. Mudge, Chaitali Chakrabarti. Improving the Reliability of MLC NAND Flash Memories Through Adaptive Data Refresh and Error Control Coding. VLSI Signal Processing, 76(3):225-234, 2014. [doi]

Abstract

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