RMS-Jitter and -64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS

Zunsong Yang, Yong Chen 0005, Pui-In Mak, Rui Paulo Martins. RMS-Jitter and -64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap., 68(6):2307-2316, 2021. [doi]

@article{YangCMM21,
  title = {RMS-Jitter and -64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS},
  author = {Zunsong Yang and Yong Chen 0005 and Pui-In Mak and Rui Paulo Martins},
  year = {2021},
  doi = {10.1109/TCSI.2021.3065462},
  url = {https://doi.org/10.1109/TCSI.2021.3065462},
  researchr = {https://researchr.org/publication/YangCMM21},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Circuits Syst. I Regul. Pap.},
  volume = {68},
  number = {6},
  pages = {2307-2316},
}