Chenglin Yang, Fang Chen, Shulin Tian. Grouped Genetic Algorithm Based Optimal Tests Selection for System with Multiple Operation Modes. J. Electronic Testing, 33(4):415-429, 2017. [doi]
@article{YangCT17-0,
title = {Grouped Genetic Algorithm Based Optimal Tests Selection for System with Multiple Operation Modes},
author = {Chenglin Yang and Fang Chen and Shulin Tian},
year = {2017},
doi = {10.1007/s10836-017-5672-y},
url = {https://doi.org/10.1007/s10836-017-5672-y},
researchr = {https://researchr.org/publication/YangCT17-0},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {33},
number = {4},
pages = {415-429},
}