Zao Yang, K.-T. Cheng, K. L. Tai. A New Bare Die Test Methodology. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 290-295, IEEE Computer Society, 1999. [doi]
@inproceedings{YangCT99,
title = {A New Bare Die Test Methodology},
author = {Zao Yang and K.-T. Cheng and K. L. Tai},
year = {1999},
url = {http://csdl.computer.org/comp/proceedings/vts/1999/0146/00/01460290abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/YangCT99},
cites = {0},
citedby = {0},
pages = {290-295},
booktitle = {17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-0146-X},
}