Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Zao Yang, K.-T. Cheng, K. L. Tai. A New Bare Die Test Methodology. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 290-295, IEEE Computer Society, 1999. [doi]
Abstract is missing.