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New ERA: new efficient reliability-aware wear leveling for endurance enhancement of flash storage devices

Ming-Chang Yang, Yuan-Hao Chang, Che-Wei Tsao, Po-Chun Huang. New ERA: new efficient reliability-aware wear leveling for endurance enhancement of flash storage devices. In The 50th Annual Design Automation Conference 2013, DAC '13, Austin, TX, USA, May 29 - June 07, 2013. pages 163, ACM, 2013. [doi]

Authors

Ming-Chang Yang

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Yuan-Hao Chang

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Che-Wei Tsao

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Po-Chun Huang

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