Ming-Chang Yang, Yuan-Hao Chang, Che-Wei Tsao, Po-Chun Huang. New ERA: new efficient reliability-aware wear leveling for endurance enhancement of flash storage devices. In The 50th Annual Design Automation Conference 2013, DAC '13, Austin, TX, USA, May 29 - June 07, 2013. pages 163, ACM, 2013. [doi]
@inproceedings{YangCTH13,
title = {New ERA: new efficient reliability-aware wear leveling for endurance enhancement of flash storage devices},
author = {Ming-Chang Yang and Yuan-Hao Chang and Che-Wei Tsao and Po-Chun Huang},
year = {2013},
doi = {10.1145/2463209.2488936},
url = {http://doi.acm.org/10.1145/2463209.2488936},
researchr = {https://researchr.org/publication/YangCTH13},
cites = {0},
citedby = {0},
pages = {163},
booktitle = {The 50th Annual Design Automation Conference 2013, DAC '13, Austin, TX, USA, May 29 - June 07, 2013},
publisher = {ACM},
isbn = {978-1-4503-2071-9},
}