Semi-supervised Log-based Anomaly Detection via Probabilistic Label Estimation

Lin Yang, Junjie Chen, Zan Wang, Weijing Wang, Jiajun Jiang, Xuyuan Dong, Wenbin Zhang. Semi-supervised Log-based Anomaly Detection via Probabilistic Label Estimation. In 43rd IEEE/ACM International Conference on Software Engineering, ICSE 2021, Madrid, Spain, 22-30 May 2021. pages 1448-1460, IEEE, 2021. [doi]

Authors

Lin Yang

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Junjie Chen

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Zan Wang

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Weijing Wang

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Jiajun Jiang

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Xuyuan Dong

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Wenbin Zhang

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