Metric Learning for Categorical and Ambiguous Features: An Adversarial Method

Xiaochen Yang, Mingzhi Dong, Yiwen Guo, Jing-Hao Xue. Metric Learning for Categorical and Ambiguous Features: An Adversarial Method. In Frank Hutter, Kristian Kersting, Jefrey Lijffijt, Isabel Valera, editors, Machine Learning and Knowledge Discovery in Databases - European Conference, ECML PKDD 2020, Ghent, Belgium, September 14-18, 2020, Proceedings, Part II. Volume 12458 of Lecture Notes in Computer Science, pages 223-238, Springer, 2020. [doi]

Abstract

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