Improving reliability of non-volatile memory technologies through circuit level techniques and error control coding

Chengen Yang, Yunus Emre, Yu Cao, Chaitali Chakrabarti. Improving reliability of non-volatile memory technologies through circuit level techniques and error control coding. EURASIP J. Adv. Sig. Proc., 2012:211, 2012. [doi]

Authors

Chengen Yang

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Yunus Emre

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Yu Cao

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Chaitali Chakrabarti

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